This study was done to elucidate the electron microscopic characteristics of certain pathogenic fungi. Four Candida species, (C. albicans, C. tropicalis, C. parapsilosis and C. glabrate) and Cryptococcus neoformans were cultured for 3 days at 300C in the Sabouraud dextrose medium. After incubation, they were stored at 40C for 24hours. Fine structures were analyzed by morphometry, and Tukey´s HSD test was used for statistics.
On scanning electron microscopy C. albicans and C. neoformans were similar in size but different in shape, showing sphero-shape or ovalo-shape in C. neoformans. Surface of C. neoformans was coarse and spiny, but Candida species examined were uniformly smooth. In size, C. glabrata was the smallest among them. Budding scar as seen on the surface of Candida species by the number ranging from 1 to 7. Cryptococcus neoformans showed one or two budding scar.
On transmission electron microscopy the cytoplasm of most yeast cells showed plentiful glycogen particles, mitochondria, peroxisomes and vacuoles. However, cell walls were different among four Candida species and Cryptococcus neoformans. The cell wall of Candida species consisted of fibrous layer, that was electron dense layer and transparent layer, in contrast to Cryptococcus neoformans consisted of electron. dense layer with lamellar structure. This layer was two times thicker than that of Candida species. The outer layer of cell wall was of radiating pattern.
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